}
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    • Tender For Supply Of Dual Beam Focused Ion Beam - Field Emission Gun Scanning Electron Microscope, roorkee-Uttarakhand

    Government Departments has published Tender For Supply Of Dual Beam Focused Ion Beam - Field Emission Gun Scanning Electron Microscope. Submission Date for this Tender is 23-10-2024. Beam Tenders in roorkee Uttarakhand. Bidders can get complete Tender details and download the document.




    Tender Notice

    45419467
    Tender For Supply Of Dual Beam Focused Ion Beam - Field Emission Gun Scanning Electron Microscope
    Global Tenders
    Indian
    Uttarakhand
    Roorkee
    23-10-2024

    Tender Details

    Tender For Supply Of Dual Beam Focused Ion Beam - Field Emission Gun Scanning Electron Microscope; 1 Dual Beam Focused Ion Beam - Field Emission Gun Scanning Electron Microscope 2 Optional items 3 EDS detector 4 Software and other relevant accessories for 3D-data acquisition of EDS, EBSD and the corresponding data visualization options. 5 Optical Stereomicroscope for positioning of Cu grids for Iamellapreparation. 6 Vacuum Twizzer for grid mounting 7 Automated Lamella preparation software 8 Two additional licenses for EDS and EBSD analysis andre-indexing ofEBSD pattern

    Key Value

    Document Fees
    Refer document
    EMD
    INR 1600000.0 /-
    Tender Value
    Refer document
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