}
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    • Tender For Dual Beam Focused Ion Beam - Field Emission Gun Scanning Electron Microscope, roorkee-Uttarakhand

    Indian Institute Of Technology has published Tender For Dual Beam Focused Ion Beam - Field Emission Gun Scanning Electron Microscope. Submission Date for this Tender is 12-09-2024. Electron Microscopes Tenders in roorkee Uttarakhand. Bidders can get complete Tender details and download the document.




    Tender Notice

    44874955
    Corrigendum : Tender For Dual Beam Focused Ion Beam - Field Emission Gun Scanning Electron Microscope
    Open Tender
    NCB
    Uttarakhand
    Roorkee
    12-09-2024

    Tender Details

    Tender For Dual Beam Focused Ion Beam - Field Emission Gun Scanning Electron Microscope

    Corrigendum Details

    Sr No CorrigendumDate Corrigendum CorrigendumType NewSubmissionDate
    1 28-08-2024 2024250209/Corrigendum/407 Technical Bid 12-09-2024

    Key Value

    Document Fees
    Refer document
    EMD
    INR 1600000.0 /-
    Tender Value
    Refer document
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