Spectroscopy Devices – Mapping Ellipsometer. The Subject Of This Public Order Is The Supply Of A Mapping Ellipsometer With The Capability Of Mapping, Automatic Sample Adjustment And Simple Analysis For Measuring Structures On Deposited/Etched Surfaces With High Resolution. On The Layers Of The Selected Materials, The Device Measures The Thickness Map, In The Case Of A Known Substrate, The Thickness Of The Highest Layer From The Multilayer. The Purpose Of The Device Is To Create A Detailed Map Of Layer Thicknesses In The Lithography Process. The Speed Of Mapping (It Takes Place Point By Point) And The Ease Of Processing The Results Are Important. The Sample Must Be Adjusted Automatically At Each Measured Point. The Device Will Be Located In A Nanofabrication Laboratory Meeting Iso5 Cleanroom Conditions; The Device Must Be Fully Compatible With These Terms. The Subject Of The Public Contract Is Defined In Detail By The Technical, Commercial And Other Contractual Conditions That Are Part Of The Tender Documentation.
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